|
Educational and
professional goals:
|
|
Understanding of properties, methods and techniques of X-ray diffraction leading to experimental determination of structure of the solid state, learning of the whole process of structural analysis. This lecture is offered mainly to those students who intend to specialize in crystallography and the solid state chemistry or physics.
|
|
Course description:
|
|
This series of lectures starts with a review of the most important and useful concepts of geometrical crystallography and then the whole proccess of structural analysis is covered. This includes properties and production of X-rays and neutrons, theoretical background of data collection and diffraction of X-rays and neutrons on crystals, parameters influencing the intensity of the scattered X-ray beams, Fourier transformation, structure factors, phase problem, direct methods, the most important formulae for the centro and noncentrosymmetrical structures, refinement of structures, electron density mapping, interpretation of the final results, chirality, absolute structure, multipolar refinemt of electron density and topological analysis of electron density.
|
