The laser light can be projected onto a sample in arbitrary shape using digital micromirror device-based projection system. The XY stage is fully motorized and can be moved with µm precision, Z axis is also motorized allowing to correct for sample depth. The sample pad can be heated using custom-made ITO-based heat stage. The optical polarizers are placed in rotatable motorized mounts allowing for precise control over polarization of light. The microscope computer can be programmed to execute advanced, multistep tasks in automatic fashion using feedback from camera and other sensors, i.e. map entire sample for optical activity by calculating the difference in sample transmission in between crossed polarizers (0° | 85° and 0° | 95°). Contact: Piotr Szustakiwicz e-mail: p.szustakiwicz@student.uw.edu.pl |
The Circular Dichroism Spectrophotometer is suitable for studying chiral materials in liquid as well as in solid state with highest sensitivity and accuracy. The spectrometer operates in the wavelength range of 150 - 1200 nm and is supplied with accessories for temperature-dependent measurement cycles and solid state sample measurements under different rotations in relation to the incident light. Contact: Dorota Grzelak e-mail: d.grzelak@uw.edu.pl |
Ensuring the contamination-free environement for synthetic and storage purpouses. Contact: Sylwia Parzyszek e-mail: sparzyszek@chem.uw.edu.pl |
On a daily basis we operate on the GENESYS 50 UV-Vis spectrophotometer with dual beam in a single-cell configuration that meets all of the specifications for critical quality control applications and precise chemical measurements. It features data resolution from 0.2 nm to 5 nm. Features: 7-inch high-resolution touchscreen user interface Local control for speed and reliability Networking capable (Wi-Fi adaptor available) Large sample compartment with front access Contact: Natalia Kowalska e-mail: n.kolsut@student.uw.edu.pl |
We have a direct access to a wide variety of analytical equipment in the facility, with our group members as independent operators:
Small Angle X-Ray Diffractometer (SAXRD)
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
Atomic Force Microscope (AFM)
Fluorescence Spectrometer (Fluorolog-QM)