SEM makes it possible to study surfaces of electrically conducting samples. SEM images provide information about topography and morphology of a studied surface. It is possible to characterize shape, size and distribution of particles which form a surface of a studied object.
It is possible to resolute objects on the order of several nm with SEM technique. The microscope is additionally equipped with EDX detector, so elemental analysis of the sample surface can be performed. In SEM technique an image is formed as a result of interaction of electron beam with a studied object. Products of this interaction (among others backscattered and secondary electrons) are collected and counted by different detectors. So an information we get depends on a detector we use. A scanning microscope at the Faculty is equipped with a secondary electrons detector.
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